The 8 linked references in paper M. Murashov V., S. Klimov M., S. Panin D., М. Мурашов В., С. Климов М., С. Панин Д. (2016) “Численное моделирование электрической проводимости контактов шероховатых тел // Numerical Modeling of Electrical Contact Conductance of Rough Bodies” / spz:neicon:technomag:y:2015:i:1:p:189-200

  1. Czaplewski D.A., Patrizi G.A., Kraus G.M., Wendt J.R., Nordquist C.D., Wolfley S.L., Baker M.S., de Boer M.P. A nanomechanical switch for integration with CMOS logic // Journal of Micromechanics and Microengineering. 2009. Vol.19, no. 8. P. 1-12. DOI: 10.1088/0960-1317/19/8/085003
  2. Gundrum D.C., Cahill D.G., Averback R.S. Thermal conductance of metal-metal interfaces // Physical Review B. 2005.Vol. 72, no. 24. Art no. 245426. DOI: 10.1103/PhysRevB.72.245426
  3. Carrete J., Gallego L.J., Varela L.M. Surface roughness and thermal conductivity of semiconductor nanowires: Going below the Casimir limit // Physical Review B. 2011.Vol. 84, no. 24. Art no. 075403. DOI: 10.1103/PhysRevB.84.075403
  4. Bidwell S. On the Electrical Resistance of Carbon Contacts // Proceedings of the Royal Society of London. 1883. Vol. 35. P. 1-18. DOI: 10.1098/rspl.1883.0001
  5. Norberg G., Dejanovic S., Hesselbom H. Contact resistance of thin metal film contacts // IEEE Transactions on Components and Packaging Technologies. 2006. Vol. 29, no. 2. P. 371-378. DOI: 10.1109/TCAPT.2006.875891
  6. Greenwood J.A. Constriction resistance and the real area of contact // British Journal of Applied Physics. 1966. Vol. 17, no.12. P. 1621-1632. DOI: 10.1088/0508-3443/17/12/310
  7. Wexler G. The size effect and the non-local Boltzmann transport equation in orifice and disk geometry // Proceedings of Physical Society. 1966. Vol. 89, no. 4. P. 927-941. DOI: 10.1088/0370-1328/89/4/316
  8. 5, no. 01, pp. 189–200. DOI: 10.7463/0115.0753353 Received: 19.01.2015 © Bauman Moscow State Technical Unversity