The 18 references with contexts in paper V. Serdyuk M., J. Titovitsky A., В. Сердюк М., И. Титовицкий А. (2017) “ОПРЕДЕЛЕНИЕ ПОКАЗАТЕЛЯ ПРЕЛОМЛЕНИЯ ПЛОСКОГО ДИЭЛЕКТРИЧЕСКОГО СЛОЯ МЕТОДОМ ИЗМЕРЕНИЯ ИНТЕНСИВНОСТЕЙ ПРОХОДЯЩИХ ПУЧКОВ // REFRACTIVE INDEX DETERMINATION FOR A PLANE DIELECTRIC LAYER USING THE MEASUREMENTS OF TRANSMITTED BEAM INTENSITY” / spz:neicon:pimi:y:2017:i:1:p:55-60

1
Singh S. Refractive index measurement and its applications. Physica Scripta, 2002, vol. 65, no. 2, pp. 167–180.
Total in-text references: 3
  1. In-text reference with the coordinate start=7518
    Prefix
    DOI: 10.21122/2220-9506-2017-8-1-55-60 56 Introduction The problem of refractive index measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter
    Exact
    [1–3]
    Suffix
    . For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9].

  2. In-text reference with the coordinate start=7672
    Prefix
    measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter [1–3]. For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection)
    Exact
    [1, 2–4]
    Suffix
    , interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having de

  3. In-text reference with the coordinate start=7844
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material)
    Exact
    [1, 2, 5, 6]
    Suffix
    and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

2
Meeteen G.H. Refractive index measurement. CRC Press, 1999, 11 p.
Total in-text references: 3
  1. In-text reference with the coordinate start=7518
    Prefix
    DOI: 10.21122/2220-9506-2017-8-1-55-60 56 Introduction The problem of refractive index measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter
    Exact
    [1–3]
    Suffix
    . For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9].

  2. In-text reference with the coordinate start=7672
    Prefix
    measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter [1–3]. For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection)
    Exact
    [1, 2–4]
    Suffix
    , interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having de

  3. In-text reference with the coordinate start=7844
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material)
    Exact
    [1, 2, 5, 6]
    Suffix
    and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

3
Sokolov V.I., Marusin N.V., Panchenko V.Ya., Savelyev A.G., Seminogov V.N., Khaydukov E.V. Determination of refractive index, extinction coefficient and thickness of thin films by the method of waveguide mode excitation. Quantum Electronics, 2013, vol. 43, no 12, pp. 1149–1153. doi: org/10.1070/QE2013v043n12ABEH015272
Total in-text references: 2
  1. In-text reference with the coordinate start=7518
    Prefix
    DOI: 10.21122/2220-9506-2017-8-1-55-60 56 Introduction The problem of refractive index measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter
    Exact
    [1–3]
    Suffix
    . For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9].

  2. In-text reference with the coordinate start=7672
    Prefix
    measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter [1–3]. For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection)
    Exact
    [1, 2–4]
    Suffix
    , interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having de

4
Astrua M., Pisani M. Prism refractive index measurement at INRiM. Meas. Sci. Technol., 2009, vol. 20, no. 9, paper no. 095305.
Total in-text references: 1
  1. In-text reference with the coordinate start=7672
    Prefix
    measurement for various dielectric materials and substances is of great importance for all fields of science and industry, which use and study the phenomenon of electromagnetic waves propagation through matter [1–3]. For its solving, one applies various techniques. There are refractometric ones (using also the phenomenon of total internal reflection)
    Exact
    [1, 2–4]
    Suffix
    , interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having de

5
Chiu M.-H., Lee J.-Y., Su D.-C. Complex refractiveindex measurement based on Fresnel’s equations and the uses of heterodyne interferometry. Applied Optics, 1999, vol. 38, no. 19, pp. 4047–4052.
Total in-text references: 1
  1. In-text reference with the coordinate start=7844
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material)
    Exact
    [1, 2, 5, 6]
    Suffix
    and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

6
Choi H.J., Lim H.H., Moon H.S., Eom T.B., Ju J.J., Cha M. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference. Optics Express, 2010, vol. 18, no. 9, pp. 9429–9434.
Total in-text references: 1
  1. In-text reference with the coordinate start=7844
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material)
    Exact
    [1, 2, 5, 6]
    Suffix
    and others [7–9]. This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

7
Ayupov B.M., GritsenkoV.A., Wong H., Kim C.W. Accurate Ellipsometric Measurement of Refractive Index and Thickness of Ultrathin Oxide Film. Journ. Electrochem. Soc., 2006, vol. 153, issue 12, pp. F277– F282. doi: 10.1149/1.2357717
Total in-text references: 1
  1. In-text reference with the coordinate start=7868
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others
    Exact
    [7–9]
    Suffix
    . This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

8
Azzam R., Bashara N. Ellipsometry and polarized light. Amsterdam, North Holland, 1977, 548 p.
Total in-text references: 2
  1. In-text reference with the coordinate start=7868
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others
    Exact
    [7–9]
    Suffix
    . This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

  2. In-text reference with the coordinate start=8642
    Prefix
    for such materials under various conditions and over various regions of electromagnetic radiation, one can investigate their physical properties, for instance, concentration and relative position of compounding phases, physical state and etc (see, for example, [11]). Among the collection of refractive index determination techniques one can highlights the ellipsometric ones
    Exact
    [8]
    Suffix
    , which allows for solving the problem of refractive index determination for various homogeneous and layered media in the wide region of electromagnetic spectrum at unknown thickness of different layers.

9
Brindza M., Flynn R.A., Shirk J.S., Beadie G. Thin sample refractive index by transmission spectroscopy. Opt. Express, 2014, vol. 22, no. 23, pp. 28537–28552. doi: 10.1364/OE.22.028537| OPTICS EXPRESS 28537
Total in-text references: 1
  1. In-text reference with the coordinate start=7868
    Prefix
    There are refractometric ones (using also the phenomenon of total internal reflection) [1, 2–4], interferometric methods (utilizing the phase relationships between various coherent fields after transmission and reflection from the testing material) [1, 2, 5, 6] and others
    Exact
    [7–9]
    Suffix
    . This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on) [10, 11].

10
Kupfer K. (ed.) Electromagnetic Aquametry. Electromagnetic Wave Interaction with Water and Moist Substances. Berlin, Springer, 2005, 530 p.
Total in-text references: 1
  1. In-text reference with the coordinate start=8186
    Prefix
    This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on)
    Exact
    [10, 11]
    Suffix
    . Using measurements of averaged dielectric permittivity for such materials under various conditions and over various regions of electromagnetic radiation, one can investigate their physical properties, for instance, concentration and relative position of compounding phases, physical state and etc (see, for example, [11]).

11
Serdyuk V.M. Dielectric study of bound water in grain at radio and microwave frequencies. Progress In Electromagnetics Research, 2008, vol. 84, pp. 379–406.
Total in-text references: 2
  1. In-text reference with the coordinate start=8186
    Prefix
    This topic acquires new importance last years due to development of study of heterogeneous disperse systems, i.e. materials produced by macro- and microparticles of different phases having developed interfaces (soils, clouds, food-stuffs, cosmetic products, building, wood, paper materials and so on)
    Exact
    [10, 11]
    Suffix
    . Using measurements of averaged dielectric permittivity for such materials under various conditions and over various regions of electromagnetic radiation, one can investigate their physical properties, for instance, concentration and relative position of compounding phases, physical state and etc (see, for example, [11]).

  2. In-text reference with the coordinate start=8517
    Prefix
    Using measurements of averaged dielectric permittivity for such materials under various conditions and over various regions of electromagnetic radiation, one can investigate their physical properties, for instance, concentration and relative position of compounding phases, physical state and etc (see, for example,
    Exact
    [11]
    Suffix
    ). Among the collection of refractive index determination techniques one can highlights the ellipsometric ones [8], which allows for solving the problem of refractive index determination for various homogeneous and layered media in the wide region of electromagnetic spectrum at unknown thickness of different layers.

12
Kizel V.A. Otrazhenie sveta [Light reflection]. Moscow, Nauka Publ., 1973, 352 p. (in Russian).
Total in-text references: 3
  1. In-text reference with the coordinate start=9131
    Prefix
    The name of the technique reveals its essence, when sought parameters of tested medium are determined by measurements of polarization ellipse parameters for reflected or transmitted beam. However, the ellipsometric technique produces low accuracy at very small absorption
    Exact
    [12]
    Suffix
    , besides, it uses complicated algorithm of refractive index computation. In the present work, we present an additional method of this index determination for transparent and low absorbing plane materials, based on field intensity measurements without taken into account phase relationships, but distinguished by simplicity of realization.

  2. In-text reference with the coordinate start=10614
    Prefix
    1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the normal propagation parameters
    Exact
    [12–15]
    Suffix
    . Here, ε is the dielectric permittivity of layer material at the frequency of incident radiation, β = cosφ and γ = (ε –1 + β2)1/2 are the parameters of normal propagation for a plane wave in air and in a dielectric, respectively, φ is the angle of wave incidence on the surface of a dielectric layer, θ = 0 for the H (or TE) polarization of incident wave, when its electric vector i

  3. In-text reference with the coordinate start=11345
    Prefix
    Usually, the Fresnel formulae are derived theoretically for incident field presented by a plane electromagnetic wave, i.e. for monochromatic radiation with determined direction of propagation in space
    Exact
    [12–15]
    Suffix
    . However, scientific experience show, that as these formulae, as the formula (1) are valid for more general case, when radiation is presented by a spatially bounded beam or by superposition of waves with various frequencies from narrow bounded frequency region.

13
Born M., Wolf E. Principles of Optics. 7th ed. Cambridge, Cambridge University Press, 1999, pp. 38–53.
Total in-text references: 3
  1. In-text reference with the coordinate start=10189
    Prefix
    Description of the method Let a beam of electromagnetic radiation of the frequency ω be incident on a plane dielectric layer of the thickness h. As it is known, for two orthogonal polarizations of a plane wave, the amplitude transmission coefficient for a dielectric layer is determined by the expression
    Exact
    [13–15]
    Suffix
    : (1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the norma

  2. In-text reference with the coordinate start=10614
    Prefix
    1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the normal propagation parameters
    Exact
    [12–15]
    Suffix
    . Here, ε is the dielectric permittivity of layer material at the frequency of incident radiation, β = cosφ and γ = (ε –1 + β2)1/2 are the parameters of normal propagation for a plane wave in air and in a dielectric, respectively, φ is the angle of wave incidence on the surface of a dielectric layer, θ = 0 for the H (or TE) polarization of incident wave, when its electric vector i

  3. In-text reference with the coordinate start=11345
    Prefix
    Usually, the Fresnel formulae are derived theoretically for incident field presented by a plane electromagnetic wave, i.e. for monochromatic radiation with determined direction of propagation in space
    Exact
    [12–15]
    Suffix
    . However, scientific experience show, that as these formulae, as the formula (1) are valid for more general case, when radiation is presented by a spatially bounded beam or by superposition of waves with various frequencies from narrow bounded frequency region.

14
Chew W.C. Waves and fields in inhomogeneous media. New York, IEEE Press, 1995, 608 p.
Total in-text references: 3
  1. In-text reference with the coordinate start=10189
    Prefix
    Description of the method Let a beam of electromagnetic radiation of the frequency ω be incident on a plane dielectric layer of the thickness h. As it is known, for two orthogonal polarizations of a plane wave, the amplitude transmission coefficient for a dielectric layer is determined by the expression
    Exact
    [13–15]
    Suffix
    : (1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the norma

  2. In-text reference with the coordinate start=10614
    Prefix
    1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the normal propagation parameters
    Exact
    [12–15]
    Suffix
    . Here, ε is the dielectric permittivity of layer material at the frequency of incident radiation, β = cosφ and γ = (ε –1 + β2)1/2 are the parameters of normal propagation for a plane wave in air and in a dielectric, respectively, φ is the angle of wave incidence on the surface of a dielectric layer, θ = 0 for the H (or TE) polarization of incident wave, when its electric vector i

  3. In-text reference with the coordinate start=11345
    Prefix
    Usually, the Fresnel formulae are derived theoretically for incident field presented by a plane electromagnetic wave, i.e. for monochromatic radiation with determined direction of propagation in space
    Exact
    [12–15]
    Suffix
    . However, scientific experience show, that as these formulae, as the formula (1) are valid for more general case, when radiation is presented by a spatially bounded beam or by superposition of waves with various frequencies from narrow bounded frequency region.

15
Ishimaru A. Electromagnetic Wave Propagation, Radiation and Scattering. Engelwood Cliffs, NJ: Prentice Hall, 1991, 637 p.
Total in-text references: 3
  1. In-text reference with the coordinate start=10189
    Prefix
    Description of the method Let a beam of electromagnetic radiation of the frequency ω be incident on a plane dielectric layer of the thickness h. As it is known, for two orthogonal polarizations of a plane wave, the amplitude transmission coefficient for a dielectric layer is determined by the expression
    Exact
    [13–15]
    Suffix
    : (1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the norma

  2. In-text reference with the coordinate start=10614
    Prefix
    1) where i = (–1)1/2 is the imaginary unite; k = ω/c is the wavenumber; Rvd, Tvd and Tdv are the amplitude coefficients of plane wave reflection and refraction on the plane boundaries «air (vacuum) – dielectric» and «dielectric – air»: (the Fresnel formulae), written in terms of the normal propagation parameters
    Exact
    [12–15]
    Suffix
    . Here, ε is the dielectric permittivity of layer material at the frequency of incident radiation, β = cosφ and γ = (ε –1 + β2)1/2 are the parameters of normal propagation for a plane wave in air and in a dielectric, respectively, φ is the angle of wave incidence on the surface of a dielectric layer, θ = 0 for the H (or TE) polarization of incident wave, when its electric vector i

  3. In-text reference with the coordinate start=11345
    Prefix
    Usually, the Fresnel formulae are derived theoretically for incident field presented by a plane electromagnetic wave, i.e. for monochromatic radiation with determined direction of propagation in space
    Exact
    [12–15]
    Suffix
    . However, scientific experience show, that as these formulae, as the formula (1) are valid for more general case, when radiation is presented by a spatially bounded beam or by superposition of waves with various frequencies from narrow bounded frequency region.

16
Serdyuk V.M., Titovitsky J.A. A simple analytic approximation for the refracted field at Gaussian beam incidence upon a boundary of absorbing medium. Journ. Electromagnetic Analysis & Applications, 2010, vol. 2, no. 11, pp. 640–648. doi: 10.4236/jemaa.2010.211084
Total in-text references: 1
  1. In-text reference with the coordinate start=11834
    Prefix
    Then, for the temporal ω and spatial β frequencies of propagation, one takes averaged values of these parameters over the temporal and spatial (angular) spectrum of incident field (see, for example,
    Exact
    [16]
    Suffix
    ). The expression (1) can be transformed to the form: 57 TDTTikhHEvddv,= −1 exp(),γ DRikhvd=−12 2 exp(),γ Rvd= − + εβγ εβγ θ θ; Tvd= + 2β εβγθ ;Tdv= + 2εγ εβγ θ θ; 58 (2) Assume that a layer is transparent, i.e. the permittivity ε is real number.

17
Hishikawa Y., N. Nakamura, Studa S., Nakano S., Kishi Y., Kuwano Y. Interference-free determination of the optical absorption coefficient and the optical gap of amorphous silicon thin films. Jap. Journ Appl. Phys., 1991, vol. 30, no. 5, pp. 1008–1014.
Total in-text references: 1
  1. In-text reference with the coordinate start=13668
    Prefix
    However, using of data on measuring of such coefficients for two different polarizations, provides the opportunity to solve this problem independently on the layer thickness, like it made in
    Exact
    [17, 18]
    Suffix
    for determining of the absorption coefficient using the amplitude coefficients of reflection and refraction. Note that in the values |TH|2 and |TE|2 (3), one can construct the function, which is not dependent on the thickness: (4) where:

18
Bhattacharyya D., Bhattacharyya S.K., Chaudhuri S., Pal A.K. Determination of refractive index of thin films beyond the absorption edge. Vacuum, 1993, vol. 44, issue 10, pp. 979–981. doi: 10.1016/0042-207X(93)90282-F 60
Total in-text references: 1
  1. In-text reference with the coordinate start=13668
    Prefix
    However, using of data on measuring of such coefficients for two different polarizations, provides the opportunity to solve this problem independently on the layer thickness, like it made in
    Exact
    [17, 18]
    Suffix
    for determining of the absorption coefficient using the amplitude coefficients of reflection and refraction. Note that in the values |TH|2 and |TE|2 (3), one can construct the function, which is not dependent on the thickness: (4) where: