The 18 references in paper K. Pantsialeyeu U., U. Mikitsevich A., A. Zharin L., К. Пантелеев В., В. Микитевич А., А. Жарин Л. (2016) “ПОСТРОЕНИЕ ИЗМЕРИТЕЛЕЙ КОНТАКТНОЙ РАЗНОСТИ ПОТЕНЦИАЛОВ // DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES” / spz:neicon:pimi:y:2016:i:1:p:7-15

1
Neuhaus, K. Scanning probe microscopy polarization experiments with polycrystalline Ce0.8Gd0.2 − xPrxO2 − δ and Ce0.8Y0.2O2 − δ single crystals at room temperature / K. Neuhaus [et al.] // Solid State Ionics. – 2015. – 6 p. (doi:10.1016/j.ssi.2015.12.012).
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2
Mazhar, M.E. Kelvin probe as an effective tool to develop sensitive p-type CuO gas sensors / M.E. Mazhar [et al.] // Sensors and Actuators B: Chemical. – 2015. – 22 p. (doi:10.1016/j.snb.2015.05.050).
(check this in PDF content)
3
Baytekin, H.T. The mosaic of Surface Charge in Contact Electrification / H.T. Baytekin [et al.] // Science. – 2011 – Vol. 333. – P. 308.
(check this in PDF content)
4
Casals, N. Influence of Mechanical Stress on the Potential Distribution on a 301 LN Stainless Steel Surface / N. Casals // Journal of The Electrochemical Society, 2015. – Vol. 9. – No 162. – P. 465–472.
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5
Шаронов, Г.В. Контроль металлических поверхностей, обработанных алмазным наноточением, по работе выхода электрона / Г.В. Шаронов [и др.] // Приборы и методы измерений. – 2015. – Т. 6, No 2. – С. 196–203.
(check this in PDF content)
6
Vorobey, R.I. Controlling the characteristics of photovoltaic cell based on their own semiconductors / R.I. Vorobey [et al.] // Przeglad Elektrotechniczny. – 2015. – No. 8. – P. 81–85.
(check this in PDF content)
7
Shuji, H. Surface state bands on silicon as electron systems in reduced dimensions at atomic scales / H. Shuji // Journal of Physics: Condensed Matter. – 2000. – Vol. 12. – No. 35. – P. 463–495.
(check this in PDF content)
8
Kondo, A. Kelvin probe imaging of photo-injected electrons in metal oxide nanosheets from metal sulfide quantum dots under remote photochromic coloration / A. Kondo [et al.] // Nanoscale. – 2015. – No. 7. – P. 12510–12515.
(check this in PDF content)
9
Жарин, А.Л. Методы зондовой электрометрии для разработки и исследования свойств перспективных материалов // Перспективные материалы и технологии: монография : в 2 т. / А.Л. Жарин, К.В. Пантелеев, А.К. Тявловский. – Витебск : Изд-во ВГТУ. – 2015. – Т. 1. – 398 с.
(check this in PDF content)
10
Li, G. Effect of thermal excitation on intermolecular charge transfer efficiency in conducting polyaniline / G. Li [et al.] // Applied physics letters. – 2004. – Vol. 85. – No. 7. – P. 1187–1189.
(check this in PDF content)
11
Klein, U. Contact potential differences measurement: Short history and experimental setup for classroom demonstration / U. Klein, W. Vollmann, A. Paulo // IEEE Transactions on Education. – 2003. – No. 46(3). – P. 338–344.
(check this in PDF content)
12
Galembeck, A. Scanning electric potential microscopy imaging of polymers: electrical charge distribution in dielectrics / A. Galembeck [et al.] // Polymer. – 2001. – Vol. 42. – P. 4845−4851.
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13
Zharin, A.L. Application Macro- and Micro Kelvin Probe in Tribological Studies / A.L. Zharin // Fundamentals of Tribology and Bridging the Gap between the 12 Macro- and Micro/Nanoscales. – Netherland : Kliwer Academic Publishers, 2001. – P. 445–466.
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14
Пантелеев, К.В. Диагностика локальных изменений пластической деформации по работе выхода электрона / К.В. Пантелеев, А.И. Свистун, А.Л. Жарин // Приборы и методы измерений. – 2015. – No 1 (10). – С. 56–63.
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15
Пантелеев, К.В. Методы измерений работы выхода электрона для контроля состояния поверхностей в процессе трения / К.В. Пантелеев, А.И. Свистун, А.Л. Жарин // Приборы и методы измерений. – 2014. – No 2. – С. 107–113.
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16
Danyluk, S. Kelvin probe’s stray capacitance and noise simulation / S. Danyluk [et al.] // Приборы и методы измерений. – 2014. – No 1 (8). – С. 94–98.
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17
Bourdopoulos, G. Delta-sigma modulators: modeling, design and applications / G. Bourdopoulos [et al.]. – London : Imperial College Press, 2003. – 260 p.
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18
Zharin, A.L. Contact Potential Difference Techniques As Probing Tools in Tribology and Surface Mapping / A.L. Zharin // Scanning Probe Microscopy in Nanoscience and Nanotechnology. – Heidelberg : SpringerVerlag, 2010. – P. 687–720.
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